Coherent artifact suppression in line-field reflection confocal microscopy using a low spatial coherence light source.

Line-field reflection confocal microscopy (LF-RCM) has the potential to add a dimension of parallelization to traditional confocal microscopy while reducing the need for two-axis beam scanning. LF-RCM systems often employ light sources with a high degree of spatial coherence. This high degree of spatial coherence potentially leads to unwanted coherent artifact in the setting of nontrivial sample scattering. Here, we (a) confirm that a coherent artifact is a nontrivial problem in LF-RCM when using spatially coherent light, and (b) demonstrate that such a coherent artifact can be mitigated through the use of reduced spatial coherence line-field sources. We demonstrate coherent noise suppression in a full-pupil line-field confocal microscope using a large number of mutually incoherent emitters from a vertical-cavity surface-emitting lasers (VCSEL) array. The coherent noise from a highly scattering sample is significantly suppressed by the use of this synthesized reduced spatial coherence light source compared to a fully coherent light source. Lastly, with scattering samples, the axial confocality of line-field confocal microscopy is compromised independent of the source spatial coherence, as demonstrated by our experimental result. Our results highlight the importance of spatial coherence engineering in parallelized reflection confocal microscopy.